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HomeMaterials Science ForumMaterials Science Forum Vols. 143-147Influence of Electron Irradiation Induced Defects...

Influence of Electron Irradiation Induced Defects on the Current-Voltage Characteristics of a Resonant Tunneling Diode

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Defects in Semiconductors 17

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Periodical:

Materials Science Forum (Volumes 143-147)

Pages:

1553-1558

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.143-147.1553

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Online since:

October 1993

Authors:

B. Grandidier, Didier Stiévenard, D. Deresmes, O. Vanbesien, D. Lippens, J.L. Lorriaux, M. Zazoui

Keywords:

Electron Irradiation, Resonant Tunneling Diodes

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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