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HomeMaterials Science ForumMaterials Science Forum Vols. 143-147Evidence for an Assisted Defect Mechanism Leading...

Evidence for an Assisted Defect Mechanism Leading to a Reduced Apparent Band Offset

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Defects in Semiconductors 17

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Periodical:

Materials Science Forum (Volumes 143-147)

Pages:

587-592

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.143-147.587

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Online since:

October 1993

Authors:

Didier Stiévenard, X. Letartre, Michel Lannoo, S. Ababou, Gérard Guillot

Keywords:

Band Offset, Defect, QW, Tunelling Effect

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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