Laser Interferometry and SMX-Techniques for Thermal Characterization of Thin Films

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 185-188)

Edited by:

K.E. Heusler

Pages:

43-52

DOI:

10.4028/www.scientific.net/MSF.185-188.43

Citation:

E. Oesterschulze et al., "Laser Interferometry and SMX-Techniques for Thermal Characterization of Thin Films", Materials Science Forum, Vols. 185-188, pp. 43-52, 1995

Online since:

March 1995

Export:

Price:

$35.00

In order to see related information, you need to Login.