Passivity and electronic properties of the silicon/silicondioxide interface

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Periodical:

Materials Science Forum (Volumes 185-188)

Edited by:

K.E. Heusler

Pages:

73-82

DOI:

10.4028/www.scientific.net/MSF.185-188.73

Citation:

H. Flietner "Passivity and electronic properties of the silicon/silicondioxide interface", Materials Science Forum, Vols. 185-188, pp. 73-82, 1995

Online since:

March 1995

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$35.00

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