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HomeMaterials Science ForumMaterials Science Forum Vols. 196-201Strain Characterization of Hg1-xFexSe-Layers by...

Strain Characterization of Hg_1-xFe_xSe-Layers by Electron Spin Resonance

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Defects in Semiconductors 18

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Periodical:

Materials Science Forum (Volumes 196-201)

Pages:

561-566

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.196-201.561

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Online since:

November 1995

Authors:

G. Hendorfer, W. Jantsch, W. Helzel, J.H. Li, Zbysław Wilamowski, T. Widmer, D. Schikora, K. Lischka

Keywords:

Strained Layer, Transition Metal

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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