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HomeMaterials Science ForumMaterials Science Forum Vols. 196-201Erbium in Silicon: A Defect System for...

Erbium in Silicon: A Defect System for Optoelectronic Intergrated Ciricuits

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Defects in Semiconductors 18

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Periodical:

Materials Science Forum (Volumes 196-201)

Pages:

585-590

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.196-201.585

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Online since:

November 1995

Authors:

Jürgen Michel, J. Palm, F.X. Gan, F.Y.G. Ren, B. Zheng, S.T. Dunham, Lionel C. Kimerling

Keywords:

Electroluminescence, Erbium, Excitation, Light Emitting Devices, Photoluminescence (PL)

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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