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HomeMaterials Science ForumMaterials Science Forum Vols. 258-263Photoluminescence Study of Erbium in Silicon with...

Photoluminescence Study of Erbium in Silicon with a Free-Electron Laser

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Defects in Semiconductors 19

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Periodical:

Materials Science Forum (Volumes 258-263)

Pages:

1497-1502

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.258-263.1497

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Online since:

December 1997

Authors:

I. Tsimperidis, T. Gregorkiewicz, H.H.P.Th. Bekman, C.J.G.M. Langerak, C.A.J. Ammerlaan

Keywords:

Free-Electron Laser, Photoluminescence (PL), Rare Earth Doping, Silicon

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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