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HomeMaterials Science ForumMaterials Science Forum Vols. 258-263Coulomb Interaction between Carriers Localized in...

Coulomb Interaction between Carriers Localized in InAs/GaAs Quantum Dots and on Point Defects

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Defects in Semiconductors 19

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Periodical:

Materials Science Forum (Volumes 258-263)

Pages:

1619-1624

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.258-263.1619

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Online since:

December 1997

Authors:

M.M. Sobolev, A.R. Kovsh, V.M. Ustinov, A.Yu. Egorov, A.E. Zhukov, M.V. Maximov, N.N. Ledentsov

Keywords:

Defect, DLTS, Quantum Dot (QD)

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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