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HomeMaterials Science ForumMaterials Science Forum Vols. 278-281

Materials Science Forum Vols. 278-281

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.278-281

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Table of Contents

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Paper Title Page

Adaptation of the Rietveld Method to the Characterization of the Lamellar Microstructure of Polymers

Authors: O. Dupont, A. Jonas, R. Legras

127

Structural Studies of Bulk Pyrocarbons by Oriented Powder Methods (Experiment and Modelisation)

Authors: I. Rannou

133

XRD Profile Analysis of Clay Minerals

Authors: D. Janeba, P. Čapková, Z. Weiss, H. Schenk

139

A Method to Determine the Volume Fraction of a Separate Component in a Diffracting Volume

Authors: T.C. Bor, M.C. Huisman, Rob Delhez, Eric Jan Mittemeijer

145

Strain Broadening Caused by Dislocations

Authors: Tamás Ungár

151

Multilayer Structures: A Comparison of Results from XRD and from Structure Imaging Techniques

Authors: V. Valvoda, M. Chládek

158

New Possibilities of X-Ray Diffraction Methods in Structure Investigations of Multilayer Materials

Authors: Jan T. Bonarski, Zbigniew Świątek, R. Ciach, Z.T. Kuźnicki, I.M. Fodchuk

164

Use of Sliding-Window Fourier Transform in the Analysis of X-Ray Reflectivity Data

Authors: R. Smigiel, A. Knoll, N. Broll, A. Cornet

170

A Computer Program for Structural Refinement from Thin Film XRD Patterns

Authors: Matteo Leoni, Paolo Scardi

177

Texture Models in Powder Diffraction Analysis

Authors: M. Järvinen

184

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