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HomeMaterials Science ForumMaterials Science Forum Vols. 338-342Characterization of Thick GaN Layers Using Guided...

Characterization of Thick GaN Layers Using Guided Optical Waves

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Silicon Carbide and Related Materials - 1999

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Periodical:

Materials Science Forum (Volumes 338-342)

Pages:

1583-1586

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.338-342.1583

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Online since:

May 2000

Authors:

D. Ciplys, R. Rimeika, M. Asif Khan, J.W. Yang, Remis Gaska, Michael S. Shur

Keywords:

Guided Optical Mode, Layer Thickness, Prism-Coupling Method, Refractive Index

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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