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HomeMaterials Science ForumMaterials Science Forum Vols. 338-342Microstructural, Optical and Electronic...

Microstructural, Optical and Electronic Investigation of Anodized 4H-SiC

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Silicon Carbide and Related Materials - 1999

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Periodical:

Materials Science Forum (Volumes 338-342)

Pages:

537-540

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.338-342.537

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Online since:

May 2000

Authors:

S. Zangooie, P.O.Å. Persson, J.N. Hilfiker, L. Hultman, H. Arwin, Qamar-ul Wahab

Keywords:

Amorphous Phase, Anisotropic Etching, Electric Resistivity, Porous SiC

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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