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HomeMaterials Science ForumMaterials Science Forum Vols. 38-41Infrared Absorption Studies of the Divacancy in...

Infrared Absorption Studies of the Divacancy in Silicon-New Properties of and Interpretation of the 0.34 eV Peak

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Defects in Semiconductors 15

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Periodical:

Materials Science Forum (Volumes 38-41)

Pages:

451-456

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.38-41.451

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Online since:

January 1989

Authors:

J. Svensson, Bengt Gunnar Svensson, Bo Monemar

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© 1989 Trans Tech Publications Ltd. All Rights Reserved

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