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HomeMaterials Science ForumMaterials Science Forum Vols. 389-393Spectra Associated with Stacking Faults in 4H-SiC...

Spectra Associated with Stacking Faults in 4H-SiC Grown in a Hot-Wall CVD Reactor

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Silicon Carbide and Related Materials 2001

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Periodical:

Materials Science Forum (Volumes 389-393)

Pages:

589-592

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.389-393.589

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Online since:

April 2002

Authors:

Song Bai, Günter Wagner, E. Shishkin, Wolfgang J. Choyke, Robert P. Devaty, M. Zhang, P. Pirouz, Tsunenobu Kimoto

Keywords:

Hot-Wall CVD, Photoluminescence (PL), Polytype, Stacking Fault

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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