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HomeMaterials Science ForumMaterials Science Forum Vols. 404-407Dislocation Studies of Thin Layers Under Stress

Dislocation Studies of Thin Layers Under Stress

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Residual Stresses VI, ECRS6

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Periodical:

Materials Science Forum (Volumes 404-407)

Pages:

715-722

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.404-407.715

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Online since:

August 2002

Authors:

Léon J. Seijbel, Jan-Dirk Kamminga, Rob Delhez

Keywords:

Dislocation, Nickel Layer, X-Ray Diffraction Line Broadening

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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