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HomeMaterials Science ForumMaterials Science Forum Vols. 404-407X-Ray Measurements of TiN Film and Steel Substrate...

X-Ray Measurements of TiN Film and Steel Substrate Subjected to External Loading

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Residual Stresses VI, ECRS6

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Periodical:

Materials Science Forum (Volumes 404-407)

Pages:

703-708

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.404-407.703

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Online since:

August 2002

Authors:

Keisuke Tanaka, Toshimasa Ito, Yoshiaki Akiniwa, Takahiro Ishii, Yasuhiro Miki

Keywords:

Four-Point Bending, Fracture Strength, Ion Beam Mixing, Loading Stress, Residual Stress, Reuss Model, Stress-Strain Curve, TiN Film, X-Ray Stress Analysis

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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