Paper Titles

Residual Stresses in Decorative Electroplated Coatings
p.683

Changes in Stress and Microstructure in Sputter Deposited Copper Films Due to Substrate Surface Effects
p.691

Evaluation of Growth and Thermal Strains/Stresses in Epitaxial Thin Films Using X-Ray Diffraction
p.697

X-Ray Measurements of TiN Film and Steel Substrate Subjected to External Loading
p.703

Macro Stress Mapping on Thin Film Buckling
p.709

Dislocation Studies of Thin Layers Under Stress
p.715

Determination of the Macroscopic Elastic Constants of a Phase Embedded in a Multiphase Polycrystal-Application to the β-Phase of a Ti-17 Titanium Based Alloy
p.723

Intergranular Stresses Determined by Diffraction and Self-consistent Model
p.729

Distribution of Residual Strain In Polycrystals : Analysis by Diffraction and Homogenisation Techniques
p.735

HomeMaterials Science ForumMaterials Science Forum Vols. 404-407Macro Stress Mapping on Thin Film Buckling

Macro Stress Mapping on Thin Film Buckling

Article Preview

Abstract:

You might also be interested in these eBooks

Residual Stresses VI, ECRS6

Info:

Periodical:

Materials Science Forum (Volumes 404-407)

Pages:

709-714

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.404-407.709

Citation:

Cite this paper

Online since:

August 2002

Authors:

Philippe Goudeau, Pascale Villain, Pierre Olivier Renault, Nobumichi Tamura, R.S. Celestre, H.A. Padmore

Keywords:

Delamination, Micro X-Ray Diffraction, Residual Stress, Strain Mapping, Thin Film

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2002 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: