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HomeMaterials Science ForumMaterials Science Forum Vols. 404-407Evaluation of Growth and Thermal Strains/Stresses...

Evaluation of Growth and Thermal Strains/Stresses in Epitaxial Thin Films Using X-Ray Diffraction

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Residual Stresses VI, ECRS6

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Periodical:

Materials Science Forum (Volumes 404-407)

Pages:

697-702

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.404-407.697

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Online since:

August 2002

Authors:

Jozef Keckes

Keywords:

Growth Stresses, Thermal Stress, X-Ray Diffraction (XRD)

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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