High-Accuracy Lattice Constant Measurements of Electron-Irradiated 6H-SiC Single Crystals

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Materials Science Forum (Volumes 433-436)

Edited by:

Peder Bergman and Erik Janzén

Pages:

289-292

Citation:

C. Seitz et al., "High-Accuracy Lattice Constant Measurements of Electron-Irradiated 6H-SiC Single Crystals", Materials Science Forum, Vols. 433-436, pp. 289-292, 2003

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September 2003

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[1] A. Rempel, H. -E. Schaefer: J. Appl. Phys. Vol. A61 (1995), p.51.

[2] R. Würschum, K. Badura-Gergen, E. A. Kümmerle, C. Grupp, H. -E. Schaefer: Phys. Rev. B Vol. 54 (1996), p.849.

[3] H. Heißenstein: Phosphordotierung von 4H- und 6H-Siliziumkarbid mittels Nuklearer Transmutation (NTD), PhD Thesis (University of Erlangen-Nürnberg, Erlangen, 2002).

[4] H. King, L. Finger: J. Appl. Cryst. Vol. 12 (1979), p.374.

[5] H. Inui, H. Mori, H. Fujita: Phil. Mag. B Vol. 61 (1990), p.107.

[6] A.A. Rempel, K. Blaurock, K.J. Reichle, W. Sprengel, H. -E. Schaefer: Mater. Sci. Forum Vol. 389-393 (2002), p.485.

[7] T. E. M. Staab, L. M. Torpo, M. J. Puska, R. M. Nieminen: Mater. Sci. Forum Vol. 353-356 (2001), p.533.

DOI: https://doi.org/10.4028/www.scientific.net/msf.353-356.533

[8] M. Krivoglaz: X-ray and neutron diffraction in nonideal crystals, 1st ed. (Springer, Berlin, 1996).

[9] C. Seitz, A. Magerl, H. Heissenstein, R. Helbig: Mater. Sci. Forum Vol. 353-356 (2001), p.287.

[10] C. Seitz: Röntgenprofilanalyse und Defekte in Neutronen-bestrahltem 6H SiC, diploma thesis (University of Erlangen-Nürnberg, Erlangen, 2000).

[11] J. Kräußlich, A. Bauer, B. Wunderlich, K. Goetz: Mater. Sci. Forum Vol. 353-356 (2001), p.319.

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