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HomeMaterials Science ForumMaterials Science Forum Vols. 433-436High-Accuracy Lattice Constant Measurements of...

High-Accuracy Lattice Constant Measurements of Electron-Irradiated 6H-SiC Single Crystals

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Silicon Carbide and Related Materials - 2002

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Periodical:

Materials Science Forum (Volumes 433-436)

Pages:

289-292

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.433-436.289

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Online since:

September 2003

Authors:

Christoph Seitz, Al. Rempel, Andreas Magerl, M. Gomm, W. Sprengel, Hans Eckhardt Schaefer

Keywords:

Electron Irradiation, Lattice Constant, Positron Annihilation, X-Ray Diffraction (XRD)

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© 2003 Trans Tech Publications Ltd. All Rights Reserved

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