Electrical and Multifrequency EPR Study of Nitrogen and Carbon Antisite-Related Native Defect in n-Type As-Grown 4H-SiC

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Periodical:

Materials Science Forum (Volumes 433-436)

Edited by:

Peder Bergman and Erik Janzén

Pages:

499-502

DOI:

10.4028/www.scientific.net/MSF.433-436.499

Citation:

E. N. Kalabukhova et al., "Electrical and Multifrequency EPR Study of Nitrogen and Carbon Antisite-Related Native Defect in n-Type As-Grown 4H-SiC", Materials Science Forum, Vols. 433-436, pp. 499-502, 2003

Online since:

September 2003

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