[1]
H.M. Hobgood, R.C. Glass, G. Augustine, et. al, Appl. Phys. Lett. 66 (1995), p.1364.
Google Scholar
[2]
W. C. Mitchel, A. Saxler, et. al. Mat. Sci. Forum 338-342 (2000), p.21.
Google Scholar
[3]
C. H. Cater, V. F. Tsvetkov, R. C. Glass, et. al. Mat. Sci. and Eng. B61-62 (1999), p.1.
Google Scholar
[4]
I. S. Gorban' and Yu. M. Suleimanov Sov. Physics - Solid State 7 (1965), p.1035.
Google Scholar
[5]
Th. Stiasny, R. Helbig, Phys. Stat. Sol. (a) 162, (1997), p.239.
Google Scholar
[6]
W. Hartung, M. Rasp, D. Hofmann, A. Winnacker Materials Science and Engineering, B61-62 (1999), p.102.
Google Scholar
[7]
E. Janzen, A. Henry, J. P. Bergman, A. Ellison, B. Magnusson, Materials Science in Semiconductor Processing 4, (2001), p.181 (a) (b) (b).
Google Scholar