Line Profile Analysis (LPA) Methods: Systematic Ranking of the Quality of their Basic Assumptions

Arnold C. Vermeulen; Rob Delhez

doi:10.4028/www.scientific.net/MSF.443-444.127

Paper Titles

Study of Submicrocrystalline Materials by Conventional Powder Diffraction and Diffuse Scattering in Transmitted Wave
p.111

Thickness Determination of Thin Polycrystalline Films by Grazing Incidence X-Ray Diffraction
p.115

XRD Line Broadening Analysis with Ball Milled Palladium
p.119

Line Broadening Analysis Using FullProf*: Determination of Microstructural Properties
p.123

Line Profile Analysis (LPA) Methods: Systematic Ranking of the Quality of their Basic Assumptions
p.127

Applicability of the Crystallite Group Method to Fibre Textured Specimens
p.131

Optimization of X-Ray Pole Figure Measurement
p.137

Single Reflection Method for Pole-Density Measurements Accounting for Secondary Extinction in Textured Films
p.141

A Quantitative Basis for Rocking Curve Measurement of Highly Oriented Polycrystalline Thin Films
p.145

HomeMaterials Science ForumMaterials Science Forum Vols. 443-444Line Profile Analysis (LPA) Methods: Systematic...

Line Profile Analysis (LPA) Methods: Systematic Ranking of the Quality of their Basic Assumptions

Abstract:

All methods of analyzing the broadening of XRD line profiles have to take into account two basic effects: broadening by the instrument - including the X-ray spectrum - and the characteristics of broadening by size effects and by lattice defects - including their interaction. These effects are handled in practice by a wide range of auxiliary assumptions. In this paper these assumptions and their quality with respect to "appropriateness of purpose" are listed and compared. By systematic ranking of these assumptions in accordance with their quality, a 2-dimensional map can be constructed that visualizes the differences in the quality of the assumptions. This 2-dimensional map brings a new viewpoint to the various methods for line profile analysis, because it enables a qualitative comparison of the assumptions of existing methods and new developments.