Study of Submicrocrystalline Materials by Conventional Powder Diffraction and Diffuse Scattering in Transmitted Wave

Radomír Kužel; D. Šimek; J. Kub; Rinat K. Islamgaliev

doi:10.4028/www.scientific.net/MSF.443-444.111

Paper Titles

Contrast Factors and Character of Dislocations in Cubic and Hexagonal Crystals
p.95

Computer Simulation for X-Ray Analysis of Nanostructured Cu Processed by Severe Plastic Deformation
p.99

The Microstructure of Mechanically Alloyed Nanocrystalline Aluminium-Magnesium
p.103

Approximate Estimation of Contributions to Pure X-Ray Diffraction Line Profiles from Crystallite Shapes, Sizes and Strains by Analysing Peak Widths
p.107

Study of Submicrocrystalline Materials by Conventional Powder Diffraction and Diffuse Scattering in Transmitted Wave
p.111

Thickness Determination of Thin Polycrystalline Films by Grazing Incidence X-Ray Diffraction
p.115

XRD Line Broadening Analysis with Ball Milled Palladium
p.119

Line Broadening Analysis Using FullProf*: Determination of Microstructural Properties
p.123

Line Profile Analysis (LPA) Methods: Systematic Ranking of the Quality of their Basic Assumptions
p.127

HomeMaterials Science ForumMaterials Science Forum Vols. 443-444Study of Submicrocrystalline Materials by...

Study of Submicrocrystalline Materials by Conventional Powder Diffraction and Diffuse Scattering in Transmitted Wave

Abstract:

Two methods were used for the analysis of submicro-crystalline copper prepared by high-pressure (6 GPa) severe plastic deformation. Conventional powder XRD study was carried in terms of the modified Williamson-Hall (WH) plots and shown large line-broadening anisotropy. A new high-resolution small-angle transmission diffuse scattering method was applied for determination of crystallite size. Two methods were used for the evaluation of the diffuse scattering - calculation of the autocorrelation function of the crystalline shape by the transformation of the measured signal and by the direct fitting. Bimodal block size distribution has to be assumed for annealed samples. This was also confirmed by classical back-reflection film method as well as by the long tails of conventional diffraction profiles.