Computer Simulation for X-Ray Analysis of Nanostructured Cu Processed by Severe Plastic Deformation

Nariman A. Enikeev; Igor V. Alexandrov; Ruslan Valiev

doi:10.4028/www.scientific.net/MSF.443-444.99

Paper Titles

Characterization of Crystalline Silicon via XRPD
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Simulation of X-Ray Powder Diffraction Patterns for One-Dimensionally Disordered Crystals
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Reconstruction of Stress and Composition Profiles from X-Ray Diffraction Experiments — How to Avoid Ghost Stresses?
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Contrast Factors and Character of Dislocations in Cubic and Hexagonal Crystals
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Computer Simulation for X-Ray Analysis of Nanostructured Cu Processed by Severe Plastic Deformation
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The Microstructure of Mechanically Alloyed Nanocrystalline Aluminium-Magnesium
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Approximate Estimation of Contributions to Pure X-Ray Diffraction Line Profiles from Crystallite Shapes, Sizes and Strains by Analysing Peak Widths
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Study of Submicrocrystalline Materials by Conventional Powder Diffraction and Diffuse Scattering in Transmitted Wave
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Thickness Determination of Thin Polycrystalline Films by Grazing Incidence X-Ray Diffraction
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Computer Simulation for X-Ray Analysis of Nanostructured Cu Processed by Severe Plastic Deformation

Abstract:

A computer simulation-based approach has been developed in order to reveal grain boundary defect structure of nanomaterials, which is described in terms of extrinsic grain boundary dislocations. On the basis of comparative analysis of numerically obtained results to experimental data, the defect structure parameters of nanostructured materials produced by severe plastic deformation have been evaluated.

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Materials Science Forum (Volumes 443-444)

Pages:

99-102

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.443-444.99

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Online since:

January 2004

Authors:

Nariman A. Enikeev, Igor V. Alexandrov, Ruslan Valiev

Keywords:

Defect Structure, Grain Boundary Dislocation, Nanostructured Materials, Severe Plastic Deformation (SPD), X-Ray Analysis

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References

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