Computer Simulation for X-Ray Analysis of Nanostructured Cu Processed by Severe Plastic Deformation

Abstract:

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A computer simulation-based approach has been developed in order to reveal grain boundary defect structure of nanomaterials, which is described in terms of extrinsic grain boundary dislocations. On the basis of comparative analysis of numerically obtained results to experimental data, the defect structure parameters of nanostructured materials produced by severe plastic deformation have been evaluated.

Info:

Periodical:

Materials Science Forum (Volumes 443-444)

Edited by:

Yvonne Andersson, Eric J. Mittemeijer and Udo Welzel

Pages:

99-102

DOI:

10.4028/www.scientific.net/MSF.443-444.99

Citation:

N. A. Enikeev et al., "Computer Simulation for X-Ray Analysis of Nanostructured Cu Processed by Severe Plastic Deformation", Materials Science Forum, Vols. 443-444, pp. 99-102, 2004

Online since:

January 2004

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Price:

$35.00

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