Paper Title:
Computer Simulation for X-Ray Analysis of Nanostructured Cu Processed by Severe Plastic Deformation
  Abstract

A computer simulation-based approach has been developed in order to reveal grain boundary defect structure of nanomaterials, which is described in terms of extrinsic grain boundary dislocations. On the basis of comparative analysis of numerically obtained results to experimental data, the defect structure parameters of nanostructured materials produced by severe plastic deformation have been evaluated.

  Info
Periodical
Materials Science Forum (Volumes 443-444)
Edited by
Yvonne Andersson, Eric J. Mittemeijer and Udo Welzel
Pages
99-102
DOI
10.4028/www.scientific.net/MSF.443-444.99
Citation
N. A. Enikeev, I. V. Alexandrov, R. Valiev, "Computer Simulation for X-Ray Analysis of Nanostructured Cu Processed by Severe Plastic Deformation", Materials Science Forum, Vols. 443-444, pp. 99-102, 2004
Online since
January 2004
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Price
$35.00
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