The Microstructure of Nanocrystalline Powders from Line Profile Analysis

Abstract:

The theoretical background currently used in line profile analysis is reviewed. It covers the size and structure imperfection effects at the origin of diffraction line broadening. The propagation of errors, i.e. old errors and new errors related to profile fitting techniques, is commented. The experimental conditions for minimising errors are described. Representative examples of microstructure characterisation of nanopowders are presented.

• Periodical: Materials Science Forum (Volumes 443-444)
• Pages: 71-76
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.443-444.71
• Online since: January 2004
• Authors: Nathalie Audebrand, Daniel Louër
• Keywords: Line Profile Analysis, Microstructure, Nanocrystalline Powder, Structure Imperfections, X-Ray Powder Diffraction

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