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HomeMaterials Science ForumMaterials Science Forum Vols. 490-491X-Ray Stress Measurement Using Whole Back...

X-Ray Stress Measurement Using Whole Back Diffraction Ring

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Residual Stresses VII, ICRS7

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Periodical:

Materials Science Forum (Volumes 490-491)

Pages:

137-142

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.490-491.137

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Online since:

July 2005

Authors:

Shin Ichi Ohya, Koichi Akita, Yuichi Shitaba, Mitsutoshi Yoshikawa

Keywords:

Diffraction Ring, Multiple Regression Analysis, Plane Stress Components, Position Sensitive Proportional Counter, X-Ray Stress Measurement

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© 2005 Trans Tech Publications Ltd. All Rights Reserved

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[1] I.C. Noyan and J.B. Cohen: Residual stress, Measurement by Diffraction and Interpretation, p.121 (Springer-Verlag, New York 1987)

[2] Soc. Mat. Sci.,Japan: Standard Method of X-ray Stress Measurement for Steel, ( Soc. Mat. Sci.,Japan, Kyoto 2002) (in Japanese)

[3] S.Taira, K.Tanaka and T.Yamazaki: J. Soc. Mat. Sci.,Japan, 27 (1978) 294 (in Japanese)