X-Ray Stress Measurement Using Whole Back Diffraction Ring

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Periodical:

Materials Science Forum (Volumes 490-491)

Edited by:

Sabine Denis, Takao Hanabusa, Bob Baoping He, Eric Mittemeijer, JunMa Nan, Ismail Cevdet Noyan, Berthold Scholtes, Keisuke Tanaka, KeWei Xu

Pages:

137-142

Citation:

S. I. Ohya et al., "X-Ray Stress Measurement Using Whole Back Diffraction Ring", Materials Science Forum, Vols. 490-491, pp. 137-142, 2005

Online since:

July 2005

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$38.00

[1] I.C. Noyan and J.B. Cohen: Residual stress, Measurement by Diffraction and Interpretation, p.121 (Springer-Verlag, New York 1987).

[2] Soc. Mat. Sci., Japan: Standard Method of X-ray Stress Measurement for Steel, ( Soc. Mat. Sci., Japan, Kyoto 2002) (in Japanese).

[3] S. Taira, K. Tanaka and T. Yamazaki: J. Soc. Mat. Sci., Japan, 27 (1978) 294 (in Japanese).

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