X-Ray Stress Measurement Using Whole Back Diffraction Ring

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 490-491)

Edited by:

Sabine Denis, Takao Hanabusa, Bob Baoping He, Eric Mittemeijer, JunMa Nan, Ismail Cevdet Noyan, Berthold Scholtes, Keisuke Tanaka, KeWei Xu

Pages:

137-142

DOI:

10.4028/www.scientific.net/MSF.490-491.137

Citation:

S. I. Ohya et al., "X-Ray Stress Measurement Using Whole Back Diffraction Ring", Materials Science Forum, Vols. 490-491, pp. 137-142, 2005

Online since:

July 2005

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.