Automatic Full-Field 3-D Profilometry Using White Light Confocal Microscopy with DMD-Based Fringe Projection

Abstract:

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A new full-field 3-D micro surface profilometer using digital micromirror device (DMD)-based fringe projection strategy and confocal principle is presented in the article. In viewing the fact that conventional laser confocal measurement method not only easily encounters undesired irregular scattering problems, but also lack scanning efficiency due to its single-point type measurement, the newly developed automatic surface profilometer deploys a DMD chip to project spatially encoded digital fringe patterns with dynamic light intensity, onto the object to obtain excellent measurement performance. A novel digital fringe pattern design with adaptive sinusoidal intensity modulation was developed for active fringe projection, to obtain optimized depth resolution with a micrometer lateral resolution in confocal measurement. Some of semiconductor components have been measured to attest the feasibility of the developed approach. The depth measurement resolution can reach better than 0.1μm and the maximal measured error was verified to be less than less than 0.5 % of the measured step size.

Info:

Periodical:

Materials Science Forum (Volumes 505-507)

Edited by:

Wunyuh Jywe, Chieh-Li Chen, Kuang-Chao Fan, R.F. Fung, S.G. Hanson,Wen-Hsiang Hsieh, Chaug-Liang Hsu, You-Min Huang, Yunn-Lin Hwang, Gerd Jäger, Y.R. Jeng, Wenlung Li, Yunn-Shiuan Liao, Chien-Chang Lin, Zong-Ching Lin, Cheng-Kuo Sung and Ching-Huan Tzeng

Pages:

361-366

DOI:

10.4028/www.scientific.net/MSF.505-507.361

Citation:

L. C. Chen et al., "Automatic Full-Field 3-D Profilometry Using White Light Confocal Microscopy with DMD-Based Fringe Projection", Materials Science Forum, Vols. 505-507, pp. 361-366, 2006

Online since:

January 2006

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Price:

$35.00

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