Stress Analysis by Kossel Microdiffraction on a Nickel-Based Single Crystal Superalloy during an In Situ Tensile Test – Comparison with Classical X-Ray Diffraction

Denis Bouscaud; Raphaël Pesci; Sophie Berveiller; Etienne  Patoor

doi:10.4028/www.scientific.net/MSF.681.1

Paper Titles

Stress Analysis by Kossel Microdiffraction on a Nickel-Based Single Crystal Superalloy during an In Situ Tensile Test – Comparison with Classical X-Ray Diffraction
p.1

The Matrix Method for Data Evaluation and its Advantages in Comparison to the Sin²ψ and Similar Methods
p.7

On Faulting in Nanocrystallites of FCC Metals
p.13

MicroGap Area Detector for Stress and Texture Analysis
p.19

X-Ray Diffraction Determination of Macro and Micro Stresses in SOFC Electrolyte and Evolution with Redox Cycling of the Anode
p.25

Neutron Diffraction Analysis of Load Transfer in DP 600 Steel During In Situ Tensile Tests
p.31

Residual Stresses in Multilayer Welds with Different Martensitic Transformation Temperatures Analyzed by High-Energy Synchrotron Diffraction
p.37

Residual Stress, Texture, and Phase Investigation of Autogenous Edge Welds Using High Energy Synchrotron Radiation
p.43

HomeMaterials Science ForumMaterials Science Forum Vol. 681Stress Analysis by Kossel Microdiffraction on a...

Stress Analysis by Kossel Microdiffraction on a Nickel-Based Single Crystal Superalloy during an In Situ Tensile Test – Comparison with Classical X-Ray Diffraction

Abstract:

A Kossel microdiffraction experimental set up is under development inside a Scanning Electron Microscope (SEM) in order to determine the crystallographic orientation as well as the inter- and intragranular strains and stresses. An area of about one cubic micrometer can be analysed using the microscope probe, which enables to study different kinds of elements such as a grain boundary, a crack, a microelectronic component, etc. The diffraction pattern is recorded by a high resolution Charge-Coupled Device (CCD) camera. The crystallographic orientation, the lattice parameters and the elastic strain tensor of the probed area are deduced from the pattern indexation using a homemade software. The purpose of this paper is to report some results achieved up to now to estimate the reliability of the Kossel microdiffraction technique.