[1]
H. Dölle, V. Hauk, Z. f. Metallkde., 69 (1978) 410–417.
Google Scholar
[2]
H. Dölle, V. Hauk, Z. f. Metallkde., 69 (1978) 682–685.
Google Scholar
[3]
H. Dölle: J. Appl. Cryst. 12 (1979) 489–501.
Google Scholar
[4]
B. Ortner: J. Appl. Cryst., 39 (2006) 401–409.
Google Scholar
[5]
J. Lu. Ed., Handbook of Measurement of Residual Stresses, The Fairmont Press, Lilburn, (1996).
Google Scholar
[6]
B. Ortner, Advances in X-ray Analysis, 50 (2007) 117.
Google Scholar
[7]
B. Ortner, Powder Diffraction, 22 (2007) 102.
Google Scholar
[8]
B. Ortner, T. Antretter, M. Hofmann, E. Werner, in A.R. Pyzalla, A. Borbély, H. P. Degischer Eds., Mat. Sci. Forum, Vol. 571–572 (2008) 225–229, Trans. Tech. Publ. (2008).
DOI: 10.4028/www.scientific.net/msf.571-572.225
Google Scholar
[9]
F. Barral et al., Met Trans. A 18 (1987) 1229.
Google Scholar
[10]
J. M. Sprauel et al., Proc ICRS2 (1989) 172.
Google Scholar
[11]
P. Van Houtte, L. De Buyser, Acta metall. Mat. 41 (1993) 323.
Google Scholar
[12]
B. Ortner, Advances in X-ray Analysis, 29 (1986) 387.
Google Scholar
[13]
R.A. Winholtz, J.B. Cohen, Aust. J. Phys. 41 (1988) 189.
Google Scholar
[14]
B. Ortner, Int. J. Mat. Res., 99 (2008) 233.
Google Scholar
[15]
B. Ortner, Advances in X-ray Analysis, 52 (2009) 763.
Google Scholar
[16]
B. Ortner, Powder Diffraction, 24-2-sup (2009) S16.
Google Scholar
[17]
H. Peiter, Handbuch der Spannungsmesspraxis, Vieweg, Braunschweig, Wiesbaden, (1992).
Google Scholar
[18]
V. Hauk, G. Vaessen, Z. f. Metallkde, 76 (1985) 102.
Google Scholar
[19]
V. Hauk: Structural and residual stress analysis by nondestructive methods, Elsevier, Amsterdam (1997).
Google Scholar
[20]
A. C. Vermeulen, Mat. Sci. Forum, 404–407 (2002) 35–42.
Google Scholar
[21]
U. Welzel et al., J. Appl. Cryst. 38 (2005) 1–29.
Google Scholar
[22]
C. Quaeyhaegens, G. Knuyt, L. M. Stals, J. Surf. Coat. Technol. 74–75 (1995) 104–109.
Google Scholar
[23]
C. Quaeyhaegens, G. Knuyt, L. M. Stals, J. Vac. Sci. Technol. A 14 (1996) 2462–2468.
Google Scholar
[24]
I.C. Noyan, J.B. Cohen: Residual Stress, Springer New York, Berlin, Heidelberg, London, Paris, Tokyo, (1987).
Google Scholar
[25]
S. Taira, K. Tanaka, T. Yamazaki, J. Soc Mat. Sci. Japan, 27–294 (1978) 251.
Google Scholar
[26]
B. Ortner, Advances in X-ray Analysis, 29 (1986) 113.
Google Scholar