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On Faulting in Nanocrystallites of FCC Metals

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Abstract:

Patterns calculated by applying the Debye function to faulted spherical nanoparticles are used to test the accuracy of modern Line Profile Analysis theory of faulting for small crystallites. The relative deviation of the determined fault density is found to be dependent on the fault position, and on the particle size. The study of the average pattern from systems of 100 particles (D = 9.8nm) shows an overestimated deviation of the determined fault density by as much as 30%.

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Residual Stresses VIII View Preview

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Periodical:

Materials Science Forum (Volume 681)

Pages:

13-18

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.681.13

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Online since:

March 2011

Authors:

Kenneth R. Beyerlein, Matteo Leoni, Robert L. Snyder, Paolo Scardi

Keywords:

Debye Function, Faulting, Line Profile Analysis, X-Ray Powder Diffraction

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© 2011 Trans Tech Publications Ltd. All Rights Reserved

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