MicroGap Area Detector for Stress and Texture Analysis

Abstract:

Article Preview

Two-dimensional x-ray diffraction is an ideal method for examining the residual stress and texture. The most dramatic development in two-dimensional x-ray diffractometry involves three critical devices, including x-ray sources, x-ray optics and detectors. The recent development in brilliant x-rays sources and high efficiency x-ray optics provided high intensity x-ray beam with the desired size and divergence. Correspondingly, the detector used in such a high performance system requires the capability to collect large two-dimensional images with high counting rate and high resolution. This paper introduces the diffraction vector approach in two-dimensional x-ray diffraction for stress and texture analysis, and an innovative large area detector based on the MikroGap™ technology.

Info:

Periodical:

Edited by:

Paolo Scardi and Cristy L. Azanza Ricardo

Pages:

19-24

DOI:

10.4028/www.scientific.net/MSF.681.19

Citation:

B. B. He "MicroGap Area Detector for Stress and Texture Analysis", Materials Science Forum, Vol. 681, pp. 19-24, 2011

Online since:

March 2011

Authors:

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.