MicroGap Area Detector for Stress and Texture Analysis

Bob B. He

doi:10.4028/www.scientific.net/MSF.681.19

Paper Titles

Stress Analysis by Kossel Microdiffraction on a Nickel-Based Single Crystal Superalloy during an In Situ Tensile Test – Comparison with Classical X-Ray Diffraction
p.1

The Matrix Method for Data Evaluation and its Advantages in Comparison to the Sin²ψ and Similar Methods
p.7

On Faulting in Nanocrystallites of FCC Metals
p.13

MicroGap Area Detector for Stress and Texture Analysis
p.19

X-Ray Diffraction Determination of Macro and Micro Stresses in SOFC Electrolyte and Evolution with Redox Cycling of the Anode
p.25

Neutron Diffraction Analysis of Load Transfer in DP 600 Steel During In Situ Tensile Tests
p.31

Residual Stresses in Multilayer Welds with Different Martensitic Transformation Temperatures Analyzed by High-Energy Synchrotron Diffraction
p.37

Residual Stress, Texture, and Phase Investigation of Autogenous Edge Welds Using High Energy Synchrotron Radiation
p.43

HomeMaterials Science ForumMaterials Science Forum Vol. 681MicroGap Area Detector for Stress and Texture...

MicroGap Area Detector for Stress and Texture Analysis

Abstract:

Two-dimensional x-ray diffraction is an ideal method for examining the residual stress and texture. The most dramatic development in two-dimensional x-ray diffractometry involves three critical devices, including x-ray sources, x-ray optics and detectors. The recent development in brilliant x-rays sources and high efficiency x-ray optics provided high intensity x-ray beam with the desired size and divergence. Correspondingly, the detector used in such a high performance system requires the capability to collect large two-dimensional images with high counting rate and high resolution. This paper introduces the diffraction vector approach in two-dimensional x-ray diffraction for stress and texture analysis, and an innovative large area detector based on the MikroGap™ technology.

You might also be interested in these eBooks

View Preview

Info:

Periodical:

Materials Science Forum (Volume 681)

Pages:

19-24

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.681.19

Citation:

Cite this paper

Online since:

March 2011

Authors:

Bob B. He

Keywords:

Area Detector, Texture, Two-Dimensional X-Ray Diffraction

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

References

[1] B. B. He, Two-dimensional X-ray Diffraction, John Wiley & Sons, Hoboken, New Jersey (2009).

Google Scholar

[2] H. J. Bunge and H. Klein, Determination of quantitative, high-resolution pole figures with the area detector, Z. Metallkd. Vol. 87, No. 6, pp.465-475, (1996).

Google Scholar

[3] K. L. Smith and R. B. Ortega, Use of a two-dimensional, position sensitive detector for collecting pole figures, Advances in X-ray Analysis, Vol. 36, pp.641-647, (1993).

DOI: 10.1007/978-1-4615-2972-9_73

Google Scholar

[4] B. B. He, U. Preckwinkel and K. L. Smith, Advantages of Using 2D Detectors for Residual Stress Measurement, Advances in X-ray Analysis, Vol. 42, pp.429-438, (1998).

Google Scholar

[5] F. Angelini, R. Bellazzini, A. Brez, M.M. Massai, R. Raffo, G. Spandre, M.A. Spezziga, The micro-gap chamber, Nucl. Instr. and Meth. Vol. 335, pp.69-77, (1993).

DOI: 10.1016/0168-9002(93)90257-i

Google Scholar

[6] Y. Giomatartis, Development and prospects of the new gaseous detector Micromegas, Nucl. Instr. and Meth. Vol. 419, p.239, (1998).

Google Scholar

[7] R. Durst, S. Carney, Y. Diawara and R. Shuvalov, Readout structure and technique for electron cloud avalanche detectors, US Patent No. 6, 340, 819, Jan. 22, (2002).

Google Scholar

[8] D. M. Khazins, B. L. Becker, Y. Diawara, R. D. Durst, B. B. He, S. A. Medved, V. Sedov and T. A. Thorson, A parallel-plate resistive-anode gaseous detector for x-ray imaging, IEEE Trans. Nucl. Sci., Vol. 51, No. 3, pp.943-947, June (2004).

DOI: 10.1109/tns.2004.829543

Google Scholar

[9] C-H. Jiang, Standard reference sample for residual stress, The 10th Chinese Conference on Residual Stress, Chongqing, China, October 11-18, (2009).

Google Scholar

[10] Bruker AXS, LEPTOS User Manual, DOC-M88-EXX052 V7, December (2009).

Google Scholar