High Resolution Orientation Distribution Function

Abstract:

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A new method for reconstructing a High Resolution Orientation Distribution Function (HRODF) from X-ray diffraction data is presented. It is shown that the method is capable of accommodating very localized features, e.g. sharp peaks from recrystallized grains on a background of a texture component from the deformed material. The underlying mathematical formalism supports all crystallographic space groups and reduces the problem to solving a (large) set of linear equations. An implementation on multi-core CPUs and Graphical Processing Units (GPUs) is discussed along with an example on simulated data.

Info:

Periodical:

Materials Science Forum (Volumes 702-703)

Edited by:

Asim Tewari, Satyam Suwas, Dinesh Srivastava, Indradev Samajdar and Arunansu Haldar

Pages:

536-539

DOI:

10.4028/www.scientific.net/MSF.702-703.536

Citation:

S. Schmidt et al., "High Resolution Orientation Distribution Function", Materials Science Forum, Vols. 702-703, pp. 536-539, 2012

Online since:

December 2011

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Price:

$35.00

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