Quantifying Damage Accumulation Using State-of-the-Art FFT Method

Abstract:

Article Preview

A 3D microstructure, measured by high-energy x-ray diffraction microscopy, is used as an input to a parallelized viscoplastic Fast Fourier Transform code (VPFFT) to simulate a tensile test. Distributions of strain, damage accumulation, neighbor interactions, and Schmid factor mismatch throughout the microstructure are calculated. These results will form the basis of a direct comparison to microstructure maps that track plastic deformation in the real sample.

Info:

Periodical:

Materials Science Forum (Volumes 702-703)

Edited by:

Asim Tewari, Satyam Suwas, Dinesh Srivastava, Indradev Samajdar and Arunansu Haldar

Pages:

515-518

DOI:

10.4028/www.scientific.net/MSF.702-703.515

Citation:

R. Pokharel et al., "Quantifying Damage Accumulation Using State-of-the-Art FFT Method", Materials Science Forum, Vols. 702-703, pp. 515-518, 2012

Online since:

December 2011

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.