Fabrication of SiC Nanopillars by Inductively Coupled SF6/O2 Plasma

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A top-down fabrication technique for nanometer scale silicon carbide (SiC) pillars has been demonstrated by using inductively coupled SF6/O2 plasma etching. At optimal etching conditions, the obtained SiC nanopillars exhibit high anisotropy features (aspect ratio ~ 6.5) with high etch depth (>7 μm). The etch characteristics of SiC nanopillars under these conditions show a high etch rate (550 nm/min) and a high selectivity (over 60 for Ni).

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66-69

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January 2012

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© 2012 Trans Tech Publications Ltd. All Rights Reserved

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