Positron Annihilation Characterization of TiO2 Doped Polystyrene

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TiO2 doped polystyrene thin films fabricated by solution cast method. The effect of dopant concentrations has been studied for the structural, morphological, optical and defects properties. The XRD results revealed that the degree of crystallinity remains largely invariant due to the presence of the polymer. Interesting results have been obtained from optical measurement which depicted that there is increase in UV-shielding efficiency with the increase in the dopant concentration as the absorbance was found to be maximum in case of UV region. Surface morphology of the films shows a rod like structure for 0.25 wt% of TiO2, while for higher concentrations the TiO2 clusters were obtained. The positron lifetime results reveal that the free volume hole concentration decreased with the increase in TiO2 concentration as intensity of o-positronium decreases with the increase in concentration of TiO2 doping.

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169-177

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October 2013

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© 2014 Trans Tech Publications Ltd. All Rights Reserved

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