XPS Analysis of Oxide Films on Lead-Free Solders with Trace Additions of Germanium and Gallium

Abstract:

A sessile drop experiment involving slow heating and cooling of lead-free solder alloys under inert gas revealed segregation of trace elements to the sample surface. Addition of germanium or gallium to Sn-0.7Cu-0.05Ni alloys promoted a metallic lustre in samples, in contrast with the blue/purple colour of the parent alloy. Alloys with Ge or Ga additions showed oxidation resistance. Depth profiling of surfaces of sample alloys with Ge or Ga showed a significant concentration of these elements within the oxide film, which may be responsible for oxidation resistance of these alloys.

• Periodical: Materials Science Forum (Volume 857)
• Pages: 63-67
• DOI: https://doi.org/10.4028/www.scientific.net/MSF.857.63
• Online since: May 2016
• Authors: K.M. Watling, A. Chandler-Temple, Kazuhiro Nogita*
• Keywords: Gallium, Germanium, Lead-Free Solder, Oxide, X-Ray Photoelectron Spectroscopy

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