Sensitivity of Zn1-xCdx Te to Tera-Hertz Signals Enhanced by Structural Orderings

S.W. Han; S.H. Kang

doi:10.4028/www.scientific.net/SSP.111.25

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HomeSolid State PhenomenaSolid State Phenomena Vol. 111Sensitivity of Zn1-xCdx Te to Tera-Hertz Signals...

Sensitivity of Zn_1-xCd_x Te to Tera-Hertz Signals Enhanced by Structural Orderings

Abstract:

A better efficiency of sensing tera-hertz signals (T-rays) depends on a better crystalline structure which is obtained by replacing a small amount of Cd on Zn sites of ZnTe crystals. Zn1-xCdxTe (ZCT) crystals were fabricated with an advanced vertical Bridgeman method and the structural properties of the ZCT crystals were studied with high resolution x-ray diffraction (HRXRD) and x-ray absorption fine structure (XAFS) measurements. The Rietveld refinement to the HRXRD data showed that the ZCT crystals at x ~ 0.05 were slightly less disordered than the ZnTe crystals. These results were confirmed by the XAFS data analysis. The better structural orderings can be directly related to the sensing and emitting efficiencies of T-ray by the ZCT crystals.

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Periodical:

Solid State Phenomena (Volume 111)

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25-30

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.111.25

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Online since:

April 2006

Authors:

S.W. Han, S.H. Kang

Keywords:

Crystal, Disorder, Semiconductor, Structure, Terahertz, XAFS, X-Ray Diffraction (XRD), ZnCdTe

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