Bi-Ge-Sb-Te Films for Reversible Phase-Change Optical Recording

Abstract:

The Bi-Ge-Sb-Te phase-change recording films were prepared by DC magnetron sputtering of Bi5Ge9Sb68Te18 and Bi5Ge3Sb74Te18 targets, individually. The surface roughness of Bi5Ge9Sb68Te18 film was relatively low. At the recording speed of 27.92 m/s, the jitter value of Bi5Ge9Sb68Te18 disk was 21.33%, but Bi5Ge3Sb74Te18 disk could not be recorded. After the aging test, the reflectivity change (Rbef.−Raft.) of Bi5Ge9Sb68Te18 film was obviously less. It could be found that the Bi5Ge9Sb68Te18 film was suitable for high-speed recording and showed the better archival life stability. As the results, the recording performance and archival life stability of phase-change optical disks were dominated by the composition of recording film.

• Periodical: Solid State Phenomena (Volume 118)
• Pages: 293-298
• DOI: https://doi.org/10.4028/www.scientific.net/SSP.118.293
• Online since: December 2006
• Authors: Su Shia Lin
• Keywords: Archival Life Stability, Bi-Ge-Sb-Te Film, Optical Disk, Phase Change, Recording

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