Failure Mechanism of Patterned ITO Electrodes on Flexible Substrate under Static and Dynamic Mechanical Stresses

Jeong Seob Oh; Young Rae Cho; Ko Eun Cheon; Md.A. Karim; Seung Jin Jung

doi:10.4028/www.scientific.net/SSP.124-126.411

Paper Titles

Cathodoluminescent Properties of Sol-Gel Derived Gd₂O₃:Eu Thin-Film Phosphors on Sapphire Substrates
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Characteristics of Amorphous Indium Zinc Oxide Anode Films on Polycarbonate Substrate for Flexible Organic Light Emitting Diode
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Optical and Electrical Properties of ITO/Ag/ITO Multilayer Thin Films Deposited by D.C. Magnetron Sputtering
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Instability of OTFT with Organic Gate Dielectrics
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Failure Mechanism of Patterned ITO Electrodes on Flexible Substrate under Static and Dynamic Mechanical Stresses
p.411

Interface Reaction between Fillers and Phosphate Glass for Barrier Ribs in Plasma Display Panel
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Characteristics of TAG:Ce Phosphor Particles Prepared by Ultrasonic Spray Pyrolysis
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ITO Contact Properties with Amorphous Silicon for AM-OLED Application
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Molecular Ordering and the Current-Voltage Characteristics of m-MTDATA Thin Films
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HomeSolid State PhenomenaSolid State Phenomena Vols. 124-126Failure Mechanism of Patterned ITO Electrodes on...

Failure Mechanism of Patterned ITO Electrodes on Flexible Substrate under Static and Dynamic Mechanical Stresses

Abstract:

The mechanism of failure of patterned ITO electrodes on PET was investigated under static and cyclic bending in the mechanical stress mode. When mechanical stresses are increased, two types of micro-cracks are observed depending on the stress modes. The direction of the micro-crack in ITO electrodes is perpendicular to the load for the static mode. The electrical resistance of an ITO electrode is related to the density of the micro-cracks and failure mechanism of ITO electrode.