Mechanism of Shunting of Nanocrystalline Silicon Solar Cells Deposited on Rough Ag/ZnO Substrates

Hongbo Li; Ronald Franken; Robert L. Stolk; Jatindra K. Rath; Ruud E.I. Schropp

doi:10.4028/www.scientific.net/SSP.131-133.27

Paper Titles

Casting Single Crystal Silicon: Novel Defect Profiles from BP Solar's Mono²^TMWafers
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Carrier Recombination Activities and Structural Properties of Small-Angle Boundaries in Multicrystalline Silicon
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Impact of Iron and Molybdenum in Mono and Multicrystalline Float-Zone Silicon Solar Cells
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Divacancy Induced Improvement for Stabilization of Silicon Conductivity versus Temperature
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Mechanism of Shunting of Nanocrystalline Silicon Solar Cells Deposited on Rough Ag/ZnO Substrates
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Advances in Structural Characterization of Thin Film Nanocrystalline Silicon for Photovoltaic Applications
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Origination and Properties of Dislocations in Thin Film Nitrides
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Metal In-Diffusion during Fe and Co-Germanidation of Germanium
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Investigation of 4H-SiC Layers Implanted by Al Ions
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Mechanism of Shunting of Nanocrystalline Silicon Solar Cells Deposited on Rough Ag/ZnO Substrates

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Periodical:

Solid State Phenomena (Volumes 131-133)

Pages:

27-32

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.131-133.27

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Online since:

October 2007

Authors:

Hongbo Li, Ronald Franken, Robert L. Stolk, Jatindra K. Rath, Ruud E.I. Schropp

Keywords:

Microcrystalline Silicon, Shunting, Solar Cell, Substrate

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References

[1] J. Meier, R. Flückiger, H. Keppner, and A. Shah, Appl. Phys. Lett. 65 (1994) 860.

Google Scholar

[2] R.H. Franken, R.L. Stolk, H. Li, C.H.M. van der Werf, J.K. Rath, R.E.I. Schropp, J. Appl. Phys (2007) in press.

Google Scholar

[3] Stolk, R.L., H. Li, J.J.H. Strengers, C.H.M. van der Werf, J.K. Rath, R.E.I. Schropp, 20th European PVSEC., Barcelona, Spain (2005) p.1655.

Google Scholar

[4] M. K. van Veen and R. E. I. Schropp, Appl. Phys. Letter, Vol 82 (2003) p.287.

Google Scholar

[5] H. Li, R.L. Stolk, C.H.M. van der Werf, R.H. Franken, J.K. Rath and R.E.I. Schropp, Journal of Non-Crystalline Solids, Vol. 352 (2006) p.1941.

DOI: 10.1016/j.jnoncrysol.2006.01.059

Google Scholar