Preparation and Characterization of Al₂O₃ Thin Films for Catalytic Activity Studies

Abstract:

In the present work, the surface properties of various Al oxide films were investigated. The oxide films were produced on a stainless steel by spray pyrolysis and cathodic deposition methods. The films obtained represent typical layers that can be used as a support in model systems to investigate alumina-based catalysts. Information about the chemical environment of the Al and O ions in the oxide films depending on the preparation conditions has been deduced from the binding energies of the Al 2p and O 1s electron core levels and corresponding Auger parameters.

• Periodical: Solid State Phenomena (Volume 159)
• Pages: 91-96
• DOI: https://doi.org/10.4028/www.scientific.net/SSP.159.91
• Online since: January 2010
• Authors: Genoveva Atanasova, Desislava Guergova, Dimitar Stoychev, Nenad Radić, Boško Grbić, Plamen Stefanov
• Keywords: Aluminium Oxide, Chemical State, Thin Film, X-Ray Photoelectron Spectroscopy (XPS)

References

[1] V. Meille: Applied Catalysis A: General 315 (2006), p.1.

[2] S. Jakschik, U. Schroeder, T. Hecht, D. Krueger, G. Dollinger, A. Bergmaier, C. Luhmann, J. W. Bartha: Applied Surface Science 211 (2003).

DOI: 10.1016/s0169-4332(03)00264-2

[3] M. Natali, G. Carta, V. Rigato, G. Rossetto, G. Salmaso, P. Zanella: Electrochimica Acta 50 (2005), p.4615.

DOI: 10.1016/j.electacta.2004.10.097

[4] J. Van de Brand, P. C. Snijders, W. G. Sloof, H. Terryn, J. H. W. de Wit: J. Phys. Chem. B 108 (2004), p.6017.

[5] P. Ascarelli, G. Moreti: Surf. Interface Anal. 7 (1) (1985), p.8.

[6] R. Weismann: Solid State Commun. 31 (1979), p.347.

[7] Yu. A. Teterin, K. E. Ivanov, A. Yu. Teterin, A. M. Lebedev, I. O. Utkin, L. Vukchevich: Journal of Electron Spectroscopy and Related Phenomena 101-103 (1999), p.401.

DOI: 10.1016/s0368-2048(98)00405-8

[8] T. Novakovic, N. Radic, B. Grbic, V. Dondur, M. Mitric, D. Randjelovic, D. Stoychev, P. Stefanov: Applied Surface Science 255 (2008), p.3049.

[9] D. Stoychev, P. Stefanov, D. Nikolova, A. Aleksandrova, G. Atanasova, Ts. Marinova: Surface and Coatings Technology 180-181 (2004), p.441.

DOI: 10.1016/j.surfcoat.2003.10.080

[10] S. Ciraci, I. P. Batra: Phys. Rev. B 28 (1983), p.982.

[11] J. A. Rotole, P. M. A. Sherwood, Fresenius: J Anal Chem 369 (2001), p.342.

[12] R. H. French: J. Am. Ceram. Soc. 73 (1990) p.477.

[13] M. L. Boltz and R. H. French: Appl. Phys. Lett. 55 (1989), p (1955).

[14] H. J. Kim, S. Y. No, D. Eom, C. S. Hwang: J. Korean Phys. Soc. 49 (3) (2006), p.1271.

[15] C. D. Wagner, D. E. Passoja, H. F. Hillery, T. G. Kinisky, H. A. Six, W. T. Jansen and J. A. Taylor: J. Vac. Sci. Technol. 21, (1982), p.933.

[16] B. G. Frederick, G. Apai and T. N. Rhodin: Surf. Sci. 244 (1991), p.67.

[17] B. G. Frederick, G. Apai and T. N. Rhodin, Phys. Rev. B 44 (1991), p.1880.

[18] G. Moretti: Journal of Electron Spectroscopy and Related Phenomena 95 (1998), p.95.

[19] C. D. Wagner, A. Joshi: J. Electron Spectrosc. Relat. Phenom. 47 (1988), p.283.

[20] C. D. Wagner, H. A. Six, W. T. Jansen, J. A. Taylor: Appl. Surf. Sci. 9 (1981), p.203.

[21] B. Gruzza, S. Merle, L. Bideux, C. Robert, L. Kover, J. Toth, V. Matolin: Applied Surface Science 175-176 (2001), p.656.

DOI: 10.1016/s0169-4332(01)00119-2