High-Speed Orientation Microscopy with Offline Solving Sequences of EBSD Patterns

Robert A. Schwarzer; Jarle Hjelen

doi:10.4028/www.scientific.net/SSP.160.295

Paper Titles

Effect of Strain Path on Microstructure and Texture Development in ECAP Processed AA3104 Alloy
p.265

Microstructure Investigation of the PVD Thin Films of TRIP Steels
p.273

Location Depending Textures of the Human Dental Enamel
p.281

The Exoskeleton of the American Lobster – From Texture to Anisotropic Properties
p.287

High-Speed Orientation Microscopy with Offline Solving Sequences of EBSD Patterns
p.295

Texture Formation during Hot-Deformation of High-Nb Containing γ-TiAl Based Alloys
p.301

Solder Joint Reliability in Automotive Applications: New Assessment Criteria through the Use of EBSD
p.307

Grain Structure Formation Ahead of Tool during Friction Stir Welding of AZ31 Magnesium Alloy
p.313

Microstructural Characterization of Friction Welded TiAl-Ti6Al4V Hybrid Joints
p.319

HomeSolid State PhenomenaSolid State Phenomena Vol. 160High-Speed Orientation Microscopy with Offline...

High-Speed Orientation Microscopy with Offline Solving Sequences of EBSD Patterns

Abstract:

A high speed in acquisition of backscatter Kikuchi patterns (BKP) and solving the stored raw patterns offline has many advantages over online EBSD. No compromise is made between speed and reliability. Automated backscatter Kikuchi diffraction in the scanning electron microscope (SEM) is about to become a tool for process and quality control. Mandatory requirements for these applications are measures to enable re-examination of the results at any time and a high speed. Therefore, fast acquisition of pattern sequences and off¬line indexing will soon become standard. Online pattern solving is optional, but at the disadvantage of reduced speed and reliability.

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Periodical:

Solid State Phenomena (Volume 160)

Pages:

295-300

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.160.295

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Online since:

February 2010

Authors:

Robert A. Schwarzer, Jarle Hjelen

Keywords:

3D Orientation Microscopy, Backscatter Kikuchi Diffraction (BKD), Calibration, Electron Backscatter Diffraction (EBSD), Hough Transform (HT), Phase Discrimination, Radon Transform

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References

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