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Defect Spectroscopy in Compound Semiconductors
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Formation and Defect Structure of FeIn Pairs in Silicon
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EPR Identification of Mn- or Cr-Acceptor Pairs in Silicon
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The Influence of RTA on Deep States in Si-Implanted GaAs MESFET Structures Investigated by DLTS and ODLTS
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Study of Electron and Hole Emission from Deep States in Undoped Semi-Insulating GaAs by PICTS and Photo-DLTS
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HomeSolid State PhenomenaSolid State Phenomena Vols. 19-20Formation and Defect Structure of FeIn Pairs in...

Formation and Defect Structure of FeIn Pairs in Silicon

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Gettering and Defect Engineering in Semiconductor Technology IV

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Periodical:

Solid State Phenomena (Volumes 19-20)

Pages:

207-214

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.19-20.207

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Online since:

January 1991

Authors:

W. Gehlhoff, P. Emanuelsson, P. Omling, Hermann G. Grimmeiss

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© 1991 Trans Tech Publications Ltd. All Rights Reserved

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