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Paper Titles
Defect Control and Gettering in Cz-Silicon
p.137
Silicon Device Engineering by Intrinsic Point Defect Control
p.169
Defect Engineering in a High-Voltage Substrate Technology
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Thermal Wafer Warpage and its Avoidance
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Defects in Crystalline Silicon - History and Outlook
p.189
Defect Spectroscopy in Compound Semiconductors
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Formation and Defect Structure of FeIn Pairs in Silicon
p.207
EPR Identification of Mn- or Cr-Acceptor Pairs in Silicon
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The Influence of RTA on Deep States in Si-Implanted GaAs MESFET Structures Investigated by DLTS and ODLTS
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Defects in Crystalline Silicon - History and Outlook

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Periodical:

Solid State Phenomena (Volumes 19-20)

Pages:

189-194

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.19-20.189

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Online since:

January 1991

Authors:

E. Sirtl

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© 1991 Trans Tech Publications Ltd. All Rights Reserved

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