Temperature Profiles Induced by Recrystallization of Silicon-on-Insulator with Scanning Incoherent Light Line Source

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Periodical:

Solid State Phenomena (Volumes 19-20)

Edited by:

M. Kittler and H. Richter

Pages:

631-638

DOI:

10.4028/www.scientific.net/SSP.19-20.631

Citation:

H.H. Richter et al., "Temperature Profiles Induced by Recrystallization of Silicon-on-Insulator with Scanning Incoherent Light Line Source", Solid State Phenomena, Vols. 19-20, pp. 631-638, 1991

Online since:

January 1991

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$35.00

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