[1]
K. Saga and T. Hattori, Appl. Phys. Lett., 71, 3670 (1997);
DOI: 10.1063/1.120476
Google Scholar
[2]
K. Saga and T. Hattori, J. Electrochem. Soc., 144, L253 (1997);
DOI: 10.1149/1.1837935
Google Scholar
[3]
S. De Gendt, et al., Jpn. J. Appl. Phys., 37, 4649 (1998); https://iopscience.iop.org/article/
Google Scholar
[4]
K.R. Dean, et al., J.Photopolymer Science and technol. 10 (1997) p.425.
Google Scholar
[5]
D. Ruede, M. Ercken and T. Borgers, Proc. SPIE 4346, Optical Microlithography XIV,(2001);
DOI: 10.1117/12.435635
Google Scholar
[6]
H. Fontaine, M. Veillerot and A. Danel, Sol. State Phenom., 103-104, p.365, (2005);
DOI: 10.4028/www.scientific.net/SSP.103-104.365
Google Scholar
[7]
ITRS2013: International Technology Roadmap for Semiconductors, Semiconductor Industry Association, (2013); http://www.itrs2.net/2013-itrs.html.
Google Scholar
[8]
W. Storm et al. In Proc. of the Second International Symposium on Ultra-Clean Processing of Silicon Surfaces ed. Acco, (1994) p.367.
Google Scholar
[9]
K. Sano et al., Solid State Phenom. 145-146 (2009) p.173;
DOI: 10.4028/www.scientific.net/SSP.145-146.173
Google Scholar
[10]
G. Schneider et al., Sol. State Phenom, 255, 381, (2016);
DOI: 10.4028/www.scientific.net/SSP.255.381
Google Scholar
[11]
Peter Franze, Germar Schneider and Stefan Kaskel, Sol. State Phenom., 314, p.41, (2021);
DOI: 10.4028/www.scientific.net/SSP.314.41
Google Scholar
[12]
Clara Zängle, Markus Pfeffer, Peter Franze, Germar Schneider, and Anton Bauer, Sol. State Phenom. 314, p.34 (2021);
DOI: 10.4028/www.scientific.net/SSP.314.34
Google Scholar
[13]
P.W. Mertens, ECSTransactions 92, p.237, (2019); https://iopscience.iop.org/article/
DOI: 10.1149/09202.0237ecst
Google Scholar
[14]
https://www.pfeiffer-vacuum.com/en/products/systems/contamination-management-solutions/ampc/container!download.action?referer=2556&download=/filepool/file/literature/brochure-contamination-management-solutions.pdf, pp.12-14.
Google Scholar
[15]
https://en.wikipedia.org/wiki/Proton-transfer-reaction_mass_spectrometry
Google Scholar
[16]
C. Lindinger,et al, Flexibility and performance of modular "ioniTOF" Time of-Fligft platform used in PTR-TOF and Api-TOF systems; Microsoft PowerPoint - TOF asms_2018_web [Schreibgeschützt] (ionicon.com)
Google Scholar
[17]
Cavity ring-down spectroscopy - Wikipedia
Google Scholar