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HomeSolid State PhenomenaSolid State Phenomena Vols. 37-38

Solid State Phenomena Vols. 37-38

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.37-38

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Paper Title Page

Copper and Nickel Precipitation in a Σ=25 Silicon Bicrystal

Authors: Richard Rizk, X. Portier, G. Allais, Gerard Nouet

145

Desorption Energy of Oxygen Adsorbed on Un-Intentionally Doped Low Pressure Chemical Vapor Deposited Silicon Films

Authors: D. Mostefa, B. Fortin, F. Raoult, M. Sarret, G. Rossé, O. Bonnaud

151

Segregation and Precipitation of Platinum Silicides in Si/SiO₂ Interfaces and Dislocations

Authors: B. Laurent, Dominique Mangelinck, Bernard Pichaud, André Lhorte, J.B. Quoirin

157

Calculation of the Atomic and Electronic Structure of the {113} Planar Interstitial Defects in Silicon

Authors: Masanori Kohyama, S. Takeda

163

Local Grain Boundary Property Measurements

Authors: D.B. Holt

171

Local Investigation of the Electrical Properties of Grain Boundaries in Silicon

Authors: J. Palm, D. Steinbach, H. Alexander

183

Investigation of Minority Carrier Diffusion Length in Multicrystalline Silicon by Quantitative Electron Beam Induced Current Mapping

Authors: A. Barhdadi, S. Sivoththaman, M. Barbe, M. Rodot, J.L. Maurice

189

Minority Charge Carrier Trapping at Grain Boundaries Provided with a High Barrier Schottky Contact

Authors: C. Häßler, P. Bittner, Gerhard Pensl, M. Schulz

195

Electrical Transport in Polycrystalline Semiconductors

Authors: O. Ka

201

Origin of Curved Arrhenius Plots for the Conductivity of Polycrystalline Semiconductors

Authors: Jens Werner

213

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