The Impact of Fe and Cu Contamination in the 1012 at/cm2 Range on the Performance of Junction Diodes

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Periodical:

Solid State Phenomena (Volumes 47-48)

Edited by:

H. Richter, M. Kittler and C. Claeys

Pages:

397-402

DOI:

10.4028/www.scientific.net/SSP.47-48.397

Citation:

A.L.P. Rotondaro et al., "The Impact of Fe and Cu Contamination in the 1012 at/cm2 Range on the Performance of Junction Diodes", Solid State Phenomena, Vols. 47-48, pp. 397-402, 1996

Online since:

July 1995

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$35.00

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