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HomeSolid State PhenomenaSolid State Phenomena Vols. 47-48The Impact of Fe and Cu Contamination in the 1012...

The Impact of Fe and Cu Contamination in the 10¹² at/cm² Range on the Performance of Junction Diodes

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Gettering and Defect Engineering in Semiconductor Technology VI

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Periodical:

Solid State Phenomena (Volumes 47-48)

Pages:

397-402

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.47-48.397

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Online since:

July 1995

Authors:

A.L.P. Rotondaro, E. Vandamme, Jan Vanhellemont, Eddy Simoen, Marc Heyns, Cor Claeys

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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