The Effect of Metallization Induced Defects on Metal-Semiconductor Contacts

Abstract:

Article Preview

Info:

Periodical:

Solid State Phenomena (Volumes 47-48)

Edited by:

H. Richter, M. Kittler and C. Claeys

Pages:

391-396

DOI:

10.4028/www.scientific.net/SSP.47-48.391

Citation:

S.A. Goodman et al., "The Effect of Metallization Induced Defects on Metal-Semiconductor Contacts", Solid State Phenomena, Vols. 47-48, pp. 391-396, 1996

Online since:

July 1995

Export:

Price:

$35.00

In order to see related information, you need to Login.