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HomeSolid State PhenomenaSolid State Phenomena Vols. 51-52Investigation of the Low-Frequency Electrical...

Investigation of the Low-Frequency Electrical Noise in Grain Boundaries and Polycrystalline Silicon Films

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Polycrystalline Semiconductors IV

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Periodical:

Solid State Phenomena (Volumes 51-52)

Pages:

397-402

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.51-52.397

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Online since:

May 1996

Authors:

N.N. Tkachenko, G.P. Kolomoets, N.I. Stroiteleva

Keywords:

1/f Noise, Carrier Concentration Fluctuations, Carrier Mobility Fluctuations, Grain Boundary, Low-Frequency Electrical Noise, Thin Film Resistor

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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