Interfacial Defects Study of the Gallium Arsenide on Silicon Heterostructure

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Periodical:

Solid State Phenomena (Volumes 6-7)

Edited by:

M. Kittler

Pages:

547-554

DOI:

10.4028/www.scientific.net/SSP.6-7.547

Citation:

A. Rocher and M.N. Charasse, "Interfacial Defects Study of the Gallium Arsenide on Silicon Heterostructure", Solid State Phenomena, Vols. 6-7, pp. 547-554, 1989

Online since:

January 1989

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$35.00

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